[Full Book] Transient Induced Latchup In Cmos Integrated Circuits

Transient Induced Latchup in CMOS Integrated Circuits PDF
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Publisher: John Wiley & Sons
Author: Ming-Dou Ker
Category : Technology & Engineering
Languages : en
Pages : 320

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Transient Induced Latchup In Cmos Integrated Circuits

Transient Induced Latchup In Cmos Integrated Circuits by Ming-Dou Ker, Transient Induced Latchup In Cmos Integrated Circuits Books available in PDF, EPUB, Mobi Format. Download Transient Induced Latchup In Cmos Integrated Circuits books, The book all semiconductor device engineers must read to gain a practical feel for latchup-induced failure to produce lower-cost and higher-density chips. Transient-Induced Latchup in CMOS Integrated Circuits equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout. Ker and Hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the critical issues that have resurfaced for CMOS technologies. Once readers can gain an understanding of the standard practices for TLU, Ker and Hsu discuss the physical mechanism of TLU under a system-level ESD test, while introducing an efficient component-level TLU measurement setup. The authors then present experimental methodologies to extract safe and area-efficient compact layout rules for latchup prevention, including layout rules for I/O cells, internal circuits, and between I/O and internal circuits. The book concludes with an appendix giving a practical example of extracting layout rules and guidelines for latchup prevention in a 0.18-micrometer 1.8V/3.3V silicided CMOS process. Presents real cases and solutions that occur in commercial CMOS IC chips Equips engineers with the skills to conserve chip layout area and decrease time-to-market Written by experts with real-world experience in circuit design and failure analysis Distilled from numerous courses taught by the authors in IC design houses worldwide The only book to introduce TLU under system-level ESD and EFT tests This book is essential for practicing engineers involved in IC design, IC design management, system and application design, reliability, and failure analysis. Undergraduate and postgraduate students, specializing in CMOS circuit design and layout, will find this book to be a valuable introduction to real-world industry problems and a key reference during the course of their careers.


[Full Book] Latchup

Latchup PDF
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Publisher: John Wiley & Sons
Author: Steven H. Voldman
Category : Technology & Engineering
Languages : en
Pages : 472

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Latchup

Transient Induced Latchup In Cmos Integrated Circuits by Steven H. Voldman, Latchup Books available in PDF, EPUB, Mobi Format. Download Latchup books, Interest in latchup is being renewed with the evolution of complimentary metal-oxide semiconductor (CMOS) technology, metal-oxide-semiconductor field-effect transistor (MOSFET) scaling, and high-level system-on-chip (SOC) integration. Clear methodologies that grant protection from latchup, with insight into the physics, technology and circuit issues involved, are in increasing demand. This book describes CMOS and BiCMOS semiconductor technology and their sensitivity to present day latchup phenomena, from basic over-voltage and over-current conditions, single event latchup (SEL) and cable discharge events (CDE), to latchup domino phenomena. It contains chapters focusing on bipolar physics, latchup theory, latchup and guard ring characterization structures, characterization testing, product level test systems, product level testing and experimental results. Discussions on state-of-the-art semiconductor processes, design layout, and circuit level and system level latchup solutions are also included, as well as: latchup semiconductor process solutions for both CMOS to BiCMOS, such as shallow trench, deep trench, retrograde wells, connecting implants, sub-collectors, heavily-doped buried layers, and buried grids – from single- to triple-well CMOS; practical latchup design methods, automated and bench-level latchup testing methods and techniques, latchup theory of logarithm resistance space, generalized alpha (a) space, beta (b) space, new latchup design methods– connecting the theoretical to the practical analysis, and; examples of latchup computer aided design (CAD) methodologies, from design rule checking (DRC) and logical-to-physical design, to new latchup CAD methodologies that address latchup for internal and external latchup on a local as well as global design level. Latchup acts as a companion text to the author’s series of books on ESD (electrostatic discharge) protection, serving as an invaluable reference for the professional semiconductor chip and system-level ESD engineer. Semiconductor device, process and circuit designers, and quality, reliability and failure analysis engineers will find it informative on the issues that confront modern CMOS technology. Practitioners in the automotive and aerospace industries will also find it useful. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, computer aided design and design integration.


[Full Book] Esd

ESD PDF
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Publisher: John Wiley & Sons
Author: Steven H. Voldman
Category : Technology & Engineering
Languages : en
Pages : 296

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Esd

Transient Induced Latchup In Cmos Integrated Circuits by Steven H. Voldman, Esd Books available in PDF, EPUB, Mobi Format. Download Esd books, A comprehensive and in-depth review of analog circuitlayout, schematic architecture, device, power network and ESDdesign This book will provide a balanced overview of analog circuitdesign layout, analog circuit schematic development,architecture of chips, and ESD design. It will start atan introductory level and will bring the reader right up to thestate-of-the-art. Two critical design aspects for analog and powerintegrated circuits are combined. The first design aspect coversanalog circuit design techniques to achieve the desired circuitperformance. The second and main aspect presents the additionalchallenges associated with the design of adequate and effective ESDprotection elements and schemes. A comprehensive list of practicalapplication examples is used to demonstrate the successfulcombination of both techniques and any potential designtrade-offs. Chapter One looks at analog design discipline, including layoutand analog matching and analog layout design practices. Chapter Twodiscusses analog design with circuits, examining: singletransistor amplifiers; multi-transistor amplifiers; active loadsand more. The third chapter covers analog design layout (alsoMOSFET layout), before Chapters Four and Five discuss analog designsynthesis. The next chapters introduce the reader to analog-digitalmixed signal design synthesis, analog signal pin ESD networks, andanalog ESD power clamps. Chapter Nine, the last chapter, covers ESDdesign in analog applications. Clearly describes analog design fundamentals (circuitfundamentals) as well as outlining the various ESDimplications Covers a large breadth of subjects and technologies, such asCMOS, LDMOS, BCD, SOI, and thick body SOI Establishes an “ESD analog design” discipline thatdistinguishes itself from the alternative ESD digital designfocus Focuses on circuit and circuit design applications Assessible, with the artwork and tutorial style of the ESD bookseries PowerPoint slides are available for university facultymembers Even in the world of digital circuits, analog and power circuitsare two very important but under-addressed topics, especially fromthe ESD aspect. Dr. Voldman’s new book will serve as anessential and practical guide to the greater IC community. Withhigh practical and academic values this book is a“bible” for professionals, graduate students, deviceand circuit designers for investigating the physics of ESD and forproduct designs and testing.


[Full Book] Nano Cmos Circuit And Physical Design

Nano CMOS Circuit and Physical Design PDF
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Publisher: John Wiley & Sons
Author: Ban Wong
Category : Technology & Engineering
Languages : en
Pages : 393

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Nano Cmos Circuit And Physical Design

Transient Induced Latchup In Cmos Integrated Circuits by Ban Wong, Nano Cmos Circuit And Physical Design Books available in PDF, EPUB, Mobi Format. Download Nano Cmos Circuit And Physical Design books, Based on the authors' expansive collection of notes taken over the years, Nano-CMOS Circuit and Physical Design bridges the gap between physical and circuit design and fabrication processing, manufacturability, and yield. This innovative book covers: process technology, including sub-wavelength optical lithography; impact of process scaling on circuit and physical implementation and low power with leaky transistors; and DFM, yield, and the impact of physical implementation.


[Full Book] Electrical Overstress Eos

Electrical Overstress  EOS  PDF
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Publisher: John Wiley & Sons
Author: Steven H. Voldman
Category : Technology & Engineering
Languages : en
Pages : 344

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Electrical Overstress Eos

Transient Induced Latchup In Cmos Integrated Circuits by Steven H. Voldman, Electrical Overstress Eos Books available in PDF, EPUB, Mobi Format. Download Electrical Overstress Eos books, "This book addresses EOS phenomena and distinguish it from other forms of phenomena such as electrostatic discharge (ESD), latchup, and EMC events"--


[Full Book] Ionizing Radiation Effects In Mos Devices And Circuits

Ionizing Radiation Effects in MOS Devices and Circuits PDF
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Publisher: John Wiley & Sons
Author: T. P. Ma
Category : Technology & Engineering
Languages : en
Pages : 608

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Ionizing Radiation Effects In Mos Devices And Circuits

Transient Induced Latchup In Cmos Integrated Circuits by T. P. Ma, Ionizing Radiation Effects In Mos Devices And Circuits Books available in PDF, EPUB, Mobi Format. Download Ionizing Radiation Effects In Mos Devices And Circuits books, The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.


[Full Book] The Esd Handbook

The ESD Handbook PDF
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Publisher: John Wiley & Sons
Author: Steven H. Voldman
Category : Technology & Engineering
Languages : en
Pages : 1168

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The Esd Handbook

Transient Induced Latchup In Cmos Integrated Circuits by Steven H. Voldman, The Esd Handbook Books available in PDF, EPUB, Mobi Format. Download The Esd Handbook books, A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.


[Full Book] Esd Basics

ESD Basics PDF
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Publisher: John Wiley & Sons
Author: Steven H. Voldman
Category : Technology & Engineering
Languages : en
Pages : 250

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Esd Basics

Transient Induced Latchup In Cmos Integrated Circuits by Steven H. Voldman, Esd Basics Books available in PDF, EPUB, Mobi Format. Download Esd Basics books, Electrostatic discharge (ESD) continues to impact semiconductormanufacturing, semiconductor components and systems, astechnologies scale from micro- to nano electronics. This bookintroduces the fundamentals of ESD, electrical overstress (EOS),electromagnetic interference (EMI), electromagnetic compatibility(EMC), and latchup, as well as provides a coherent overview of thesemiconductor manufacturing environment and the final systemassembly. It provides an illuminating look into the integration ofESD protection networks followed by examples in specifictechnologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturingissues, ESD semiconductor chip design, and system problemsconfronted today as well as the future of ESD phenomena andnano-technology. Look inside for extensive coverage on: The fundamentals of electrostatics, triboelectric charging, andhow they relate to present day manufacturing environments ofmicro-electronics to nano-technology Semiconductor manufacturing handling and auditing processing toavoid ESD failures ESD, EOS, EMI, EMC, and latchup semiconductor component andsystem level testing to demonstrate product resilience from humanbody model (HBM), transmission line pulse (TLP), charged devicemodel (CDM), human metal model (HMM), cable discharge events (CDE),to system level IEC 61000-4-2 tests ESD on-chip design and process manufacturing practices andsolutions to improve ESD semiconductor chip solutions, alsopractical off-chip ESD protection and system level solutions toprovide more robust systems System level concerns in servers, laptops, disk drives, cellphones, digital cameras, hand held devices, automobiles, and spaceapplications Examples of ESD design for state-of-the-art technologies,including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS(HVCMOS), RF CMOS, smart power, magnetic recording technology,micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to ProductUse complements the author’s series of books on ESDprotection. For those new to the field, it is an essentialreference and a useful insight into the issues that confront moderntechnology as we enter the Nano-electronic Era.


[Full Book] Radiation Effects On Integrated Circuits And Systems For Space Applications

Radiation Effects on Integrated Circuits and Systems for Space Applications PDF
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Publisher: Springer
Author: Raoul Velazco
Category : Technology & Engineering
Languages : en
Pages : 401

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Radiation Effects On Integrated Circuits And Systems For Space Applications

Transient Induced Latchup In Cmos Integrated Circuits by Raoul Velazco, Radiation Effects On Integrated Circuits And Systems For Space Applications Books available in PDF, EPUB, Mobi Format. Download Radiation Effects On Integrated Circuits And Systems For Space Applications books, This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.


[Full Book] Electrostatic Discharge Protection

Electrostatic Discharge Protection PDF
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Publisher: CRC Press
Author: Juin J. Liou
Category : Technology & Engineering
Languages : en
Pages : 304

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Electrostatic Discharge Protection

Transient Induced Latchup In Cmos Integrated Circuits by Juin J. Liou, Electrostatic Discharge Protection Books available in PDF, EPUB, Mobi Format. Download Electrostatic Discharge Protection books, Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.


[Full Book] The Esd Control Program Handbook

The ESD Control Program Handbook PDF
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Publisher: John Wiley & Sons
Author: Jeremy M. Smallwood
Category : Technology & Engineering
Languages : en
Pages : 544

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The Esd Control Program Handbook

Transient Induced Latchup In Cmos Integrated Circuits by Jeremy M. Smallwood, The Esd Control Program Handbook Books available in PDF, EPUB, Mobi Format. Download The Esd Control Program Handbook books, Provides the understanding and practical skills needed to develop and maintain an effective ESD control program for manufacturing, storage, and handling of ESD sensitive components This essential guide to ESD control programs explains the principles and practice of ESD control in an easily accessible way whilst also providing more depth and a wealth of references for those who want to gain a deeper knowledge of the subject. It describes static electricity and ESD principles such as triboelectrification, electrostatic fields, and induced voltages, with the minimum of theory or mathematics. It is designed for the reader to "dip into" as required, rather than need to read cover to cover. The ESD Control Program Handbook begins with definitions and commonly used terminology, followed by the principles of static electricity and ESD control. Chapter 3 discusses ESD susceptible electronic devices, and how ESD susceptibility of a component is measured. This is followed by the “Seven habits of a highly effective ESD program”, explaining the essential activities of an effective ESD control program. While most texts mainly address manual handling of ESD susceptible devices, Chapter 5 extends the discussion to ESD control in automated systems, processes and handling, which form a major part of modern electronic manufacture. Chapter 6 deals with requirements for compliance given by the IEC 61340-5-1 and ANSI/ESD S20.20 ESD control standards. Chapter 7 gives an overview of the selection, use, care and maintenance of equipment and furniture commonly used to control ESD risks. The chapter explains how these often work together as part of a system and must be specified with that in mind. ESD protective packaging is available in an extraordinary range of forms from bags, boxes and bubble wrap to tape and reel packaging for automated processes. The principles and practice of this widely misunderstood area of ESD control are introduced in Chapter 8. The thorny question of how to evaluate an ESD control program is addressed in Chapter 9 with a goal of compliance with a standard as well as effective control of ESD risks and possible customer perceptions. Whilst evaluating an existing ESD control program provides challenges, developing an ESD control program from scratch provides others. Chapter 10 gives an approach to this. Standard test methods used in compliance with ESD control standards are explained and simple test procedures given in Chapter 11. ESD Training has long been recognised as essential in maintaining effective ESD control. Chapter 12 discusses ways of covering essential topics and how to demonstrate static electricity in action. The book ends with a look at where ESD control may go in the near future. The ESD Control Program Handbook: Gives readers a sound understanding of the subject to analyze the ESD control requirements of manufacturing processes, and develop an effective ESD control program Provides practical knowledge, as well as sufficient theory and background to understand the principles of ESD control Teaches how to track and identify how ESD risks arise, and how to identify fitting means for minimizing or eliminating them Emphasizes working with modern ESD control program standards IEC 61340-5-1 and ESD S20:20 The ESD Control Program Handbook is an invaluable reference for anyone tasked with setting up, evaluating, or maintaining an effective ESD control program, training personnel, or making ESD control related measurements. It would form an excellent basis for a University course on the subject as well as a guide and resource for industry professionals.


[Full Book] Proceedings Of The Ieee 1999 Custom Integrated Circuits Conference

Proceedings of the IEEE 1999 Custom Integrated Circuits Conference PDF
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Publisher:
Author: IEEE Solid-State Circuits Society
Category : Integrated circuits
Languages : en
Pages : 668

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Proceedings Of The Ieee 1999 Custom Integrated Circuits Conference

Transient Induced Latchup In Cmos Integrated Circuits by IEEE Solid-State Circuits Society, Proceedings Of The Ieee 1999 Custom Integrated Circuits Conference Books available in PDF, EPUB, Mobi Format. Download Proceedings Of The Ieee 1999 Custom Integrated Circuits Conference books,


[Full Book] System Level Esd Protection

System Level ESD Protection PDF
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Publisher: Springer Science & Business Media
Author: Vladislav Vashchenko
Category : Technology & Engineering
Languages : en
Pages : 320

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System Level Esd Protection

Transient Induced Latchup In Cmos Integrated Circuits by Vladislav Vashchenko, System Level Esd Protection Books available in PDF, EPUB, Mobi Format. Download System Level Esd Protection books, This book addresses key aspects of analog integrated circuits and systems design related to system level electrostatic discharge (ESD) protection. It is an invaluable reference for anyone developing systems-on-chip (SoC) and systems-on-package (SoP), integrated with system-level ESD protection. The book focuses on both the design of semiconductor integrated circuit (IC) components with embedded, on-chip system level protection and IC-system co-design. The readers will be enabled to bring the system level ESD protection solutions to the level of integrated circuits, thereby reducing or completely eliminating the need for additional, discrete components on the printed circuit board (PCB) and meeting system-level ESD requirements. The authors take a systematic approach, based on IC-system ESD protection co-design. A detailed description of the available IC-level ESD testing methods is provided, together with a discussion of the correlation between IC-level and system-level ESD testing methods. The IC-level ESD protection design is demonstrated with representative case studies which are analyzed with various numerical simulations and ESD testing. The overall methodology for IC-system ESD co-design is presented as a step-by-step procedure that involves both ESD testing and numerical simulations.


[Full Book] Electrical Overstress Electrostatic Discharge Symposium Proceedings

Electrical Overstress Electrostatic Discharge Symposium Proceedings PDF
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Publisher:
Author:
Category : Electric discharges
Languages : en
Pages :

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Electrical Overstress Electrostatic Discharge Symposium Proceedings

Transient Induced Latchup In Cmos Integrated Circuits by , Electrical Overstress Electrostatic Discharge Symposium Proceedings Books available in PDF, EPUB, Mobi Format. Download Electrical Overstress Electrostatic Discharge Symposium Proceedings books,


[Full Book] Microelectronics Failure Analysis

Microelectronics Failure Analysis PDF
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Publisher: ASM International
Author:
Category : Technology & Engineering
Languages : en
Pages : 800

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Microelectronics Failure Analysis

Transient Induced Latchup In Cmos Integrated Circuits by , Microelectronics Failure Analysis Books available in PDF, EPUB, Mobi Format. Download Microelectronics Failure Analysis books, For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron


[Full Book] Semiconductor Silicon

Semiconductor Silicon PDF
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Publisher:
Author:
Category : Semiconductors
Languages : en
Pages :

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Semiconductor Silicon

Transient Induced Latchup In Cmos Integrated Circuits by , Semiconductor Silicon Books available in PDF, EPUB, Mobi Format. Download Semiconductor Silicon books,


[Full Book] Failure Analysis

Failure Analysis PDF
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Publisher: John Wiley & Sons
Author: Marius Bazu
Category : Technology & Engineering
Languages : en
Pages : 344

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Failure Analysis

Transient Induced Latchup In Cmos Integrated Circuits by Marius Bazu, Failure Analysis Books available in PDF, EPUB, Mobi Format. Download Failure Analysis books, Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.